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Scanning electron acoustic microscopy of indentation-induced cracks and residual stresses in ceramics

John H. CantrellCavendish Laboratory, University of Cambridge, Madingley Road, Cambridge CB3 0HE, United KingdomMenglu QianCavendish Laboratory, University of Cambridge, Madingley Road, Cambridge CB3 0HE, United KingdomM. RavichandranUniversity of Cambridge, Department of Materials Science and Metallurgy, Pembroke Street, Cambridge CB2 3QZ, United KingdomK. M. KnowlesUniversity of Cambridge, Department of Materials Science and Metallurgy, Pembroke Street, Cambridge CB2 3QZ, United Kingdom
1990en
ABI

Abstract

The ability of scanning electron acoustic microscopy (SEAM) to characterize ceramic materials is assessed. SEAM images of Vickers indentations in SiC whisker-reinforced alumina clearly reveal not only the radial cracks, the length of which can be used to estimate the fracture toughness of the material, but also reveal strong contrast, interpreted as arising from the combined effects of lateral cracks and the residual stress field left in the SiC whisker-reinforced alumina by the indenter. The strong contrast is removed after the material is heat treated at 1000 °C to relieve the residual stresses around the indentations. A comparison of these observations with SEAM and reflected polarized light observations of Vickers indentations in soda-lime glass both before and after heat treatment confirms our interpretation of the strong contrast.

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