Crystallite size determination in μc-Ge films by x-ray diffraction and Raman line profile analysis
Daniel Rodrigues dos SantosInstituto de Física, UNICAMP C.P. 6165, 13081 Campinas, S.P., BrazilÍ. TorrianiInstituto de Física, UNICAMP C.P. 6165, 13081 Campinas, S.P., Brazil
1993en
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Cited by 20 references