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Magnetoresistance Amplification Effect in Silicon Transistor Device

Tao WangKey Laboratory for Magnetism and Magnetic materials of Ministry of Education Lanzhou University Lanzhou 730000 ChinaDezheng YangKey Laboratory for Magnetism and Magnetic materials of Ministry of Education Lanzhou University Lanzhou 730000 ChinaMingsu SiKey Laboratory for Magnetism and Magnetic materials of Ministry of Education Lanzhou University Lanzhou 730000 ChinaFangcong WangKey Laboratory for Magnetism and Magnetic materials of Ministry of Education Lanzhou University Lanzhou 730000 ChinaShiming ZhouDepartment of Physics Tongji University Shanghai 200092 ChinaDesheng XueKey Laboratory for Magnetism and Magnetic materials of Ministry of Education Lanzhou University Lanzhou 730000 China
2016en
ABI

Abstract

Large magnetoresistance discovered in nonmagnetic semiconductors offers an alternative route to renew magnetoelectronics without ferromagnets. However, it is still a great challenge to retain such large magnetoresistance under low magnetic fields. In this work, analogous to current amplification in the transistor, a magnetoresistance amplification effect is proposed in silicon transistor device, where the device current is significantly controlled by magnetic‐field‐manipulated coupling of two p – n junctions in transistor. As a direct consequence, large magnetoresistance of 50 000% with high sensitivity of 50% Oe ‐1 is yielded at magnetic field of only 0.1 T. The results not only provide here a new proposal compatible with current semiconductor technology to achieve large magntoresistance at low magnetic field, but also realize magnetic‐field‐manipulated transistor, which is a step for magnetoelectronics.

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