Study of the nonlinear refractive index of chalcogenide films by the RZ-scan method
A. I. Ryasnyanskiı̆Samarkand State University, Samarkand, 703004, Uzbekistan
ABI
Abstract
Results of studying nonlinear refraction of chalcogenide films by the RZ-scan method with the use of radiation of a picosecond Nd:YAG laser (λ = 532 nm) are presented. The sign of the nonlinear refractive index is analyzed with the help of the Kramers-Kronig relations. Mechanisms of nonlinear refraction in materials are discussed.