Picosecond nonlinear refraction measurement in single-beam open Z scan by charge-coupled device image processing
A. Marcano O.Centro de Fisica, Instituto Venezolano de Investigaciones Cientificas, Apartado 21827, Caracas 1020 A, VenezuelaH. MaillotteLaboratoire d’ Optique P. M. Duffieux, Unité de Recheche Associée Centre National de la Recherche Scientifique 214, Université de Franche-Comté, 16 route de Gray, 25030 Besançon Cedex, FranceDenis GindreLaboratoire d’ Optique P. M. Duffieux, Unité de Recheche Associée Centre National de la Recherche Scientifique 214, Université de Franche-Comté, 16 route de Gray, 25030 Besançon Cedex, FranceD. MétinLaboratoire d’ Optique P. M. Duffieux, Unité de Recheche Associée Centre National de la Recherche Scientifique 214, Université de Franche-Comté, 16 route de Gray, 25030 Besançon Cedex, France
1996en
ABI
Abstract
We propose a picosecond single-beam open Z-scan experiment in which the usual apertured detection scheme is replaced by a two-dimensional single-shot CCD camera. This enables us to extract the two-dimensional transverse modifications of the whole far-f ield pattern that are due to nonlinear refraction as well as to measure the induced nonlinear phase shift with increased sensitivity compared with that of the conventional Z scan.
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Cited by 20 references