Effects of 2 mass % Si admixture in a laser-produced Fe plasma
J. KrásaASCR 1 Institute of Physics, , v.v.i., 182 21 Prague 8, Czech RepublicL. LáskaASCR 1 Institute of Physics, , v.v.i., 182 21 Prague 8, Czech RepublicK. RohlenaASCR 1 Institute of Physics, , v.v.i., 182 21 Prague 8, Czech RepublicA. VelyhanASCR 1 Institute of Physics, , v.v.i., 182 21 Prague 8, Czech RepublicA. LorussoINFN of Lecce 2 Department of Physics of Lecce, Laboratorio di Elettronica Applicata e Strumentazione (LEAS), , 73100 Lecce, ItalyV. NassisiINFN of Lecce 2 Department of Physics of Lecce, Laboratorio di Elettronica Applicata e Strumentazione (LEAS), , 73100 Lecce, ItalyA. CzarneckaEURATOM Association 3 Institute of Plasma Physics and Laser Microfusion, , 00-908 Warsaw, PolandP. ParysEURATOM Association 3 Institute of Plasma Physics and Laser Microfusion, , 00-908 Warsaw, PolandL. RyćEURATOM Association 3 Institute of Plasma Physics and Laser Microfusion, , 00-908 Warsaw, PolandJerzy WołowskiEURATOM Association 3 Institute of Plasma Physics and Laser Microfusion, , 00-908 Warsaw, Poland
2008en
ABI
Abstract
Emission of multiply charged ions and soft x-rays from the plasmas produced by laser pulses focused on (111) surface of Fe and Fe−2 mass % Si single crystals is investigated for wavelengths of 1064 and 248 nm and intensities up to ≈1×1010 W/cm2. It is demonstrated that the Si admixture in the Fe plasma results in a higher emission of Feq+ ions (1≤q≤4) but in a markedly lower x-ray emission. The relation of wavelengths and pulse durations of laser beams used is figured in the fluence dependence of the ion emission.
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