Spectral selective plasma imaging in the wavelength range 2.4 - 4.5 nm in SPEED 2 device
S. V. BobashevA-F-Ioffe Physical-Technical-Institute, Russian Academy of Sciences, 194021 St Petersburg, RussiaD. M. SimanovskiiA-F-Ioffe Physical-Technical-Institute, Russian Academy of Sciences, 194021 St Petersburg, RussiaYu.Ya. PlatonovInstitute for Physics of Microstructures, Russian Academy of Sciences, 603600 Nizhnii Novgorod, RussiaP. RöwekampInstitut für Experimentalphysik, Heinrich-Heine-Universität, 40225 Düsseldorf, GermanyG. DeckerInstitut für Experimentalphysik, Heinrich-Heine-Universität, 40225 Düsseldorf, GermanyW. KiesInstitut für Experimentalphysik, Heinrich-Heine-Universität, 40225 Düsseldorf, Germany
1996en
ABI
Abstract
X-ray images of the compression phase of a deuterium-embedded argon pinch plasma generated with the SPEED 2 driver in a plasma focus configuration were obtained. To record spectral selective images, an x-ray microscope based on cylindrically bent multilayer mirrors (MLMs) mounted in a parallel configuration was developed. The plasma images were taken at different wavelengths in the interval from 2.4 to 4.5 nm with a spectral resolution of and a spatial resolution of approximately 80 m within a 30 mm diameter field of view. A strong wavelength dependence of the shape and the size of the emitting regions of the plasma was found. Images of bright spots with a size of about 0.5 mm identified as being early stages of micropinches were obtained.
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