Application of atomic and molecular primary ions for TOF–SIMS analysis of additive containing polymer surfaces
D. StapelPhysikalisches Institut, Universität Münster, Wihelm-Klemm-Strasse 10, D-48149 Münster, FRG, GermanyA. BenninghovenPhysikalisches Institut, Universität Münster, Wihelm-Klemm-Strasse 10, D-48149 Münster, FRG, Germany
2001en
ABI
Abstract
No abstract available.
Identifiers
Citations and references
Cited by 50 references