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Determination of ZnSe(Te) stoichiometry and dopant content by X-ray analysis

N. M. MukhamedshinaInstitute of Nuclear Physics, Ulugbek, Tashkent, 702132, UzbekistanA. A. MirsagatovaInstitute of Nuclear Physics, Ulugbek, Tashkent, 702132, UzbekistanВ. Г. ЗиновьевInstitute of Nuclear Physics, Ulugbek, Tashkent, 702132, Uzbekistan
Journal of Radioanalytical and Nuclear Chemistryjournal2005en
ABI

Abstract

No abstract available.

Topics

Chalcogenide Semiconductor Thin FilmsQuantum Dots Synthesis And PropertiesAdvanced Semiconductor Detectors and Materials

Identifiers

DOI
10.1007/s10967-005-0680-2

Citations and references

Cited by 10 references
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