Article

RTN distribution comparison for bulk, FDSOI and FinFETs devices

Louis GerrerDevice Modelling Group, Univ. of Glasgow, G12 8LT, UKSalvatore AmorosoDevice Modelling Group, Univ. of Glasgow, G12 8LT, UKRazaidi HussinDevice Modelling Group, Univ. of Glasgow, G12 8LT, UKA. AsenovDevice Modelling Group, Univ. of Glasgow, G12 8LT, UK

2014en

ABI

Abstract

No abstract available.

Identifiers

DOI: 10.1016/j.microrel.2014.07.013

Citations and references

Cited by 30 references

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