Article

Single-trap-induced random telegraph noise for FinFET, Si/Ge Nanowire FET, Tunnel FET, SRAM and logic circuits

Ming-Long FanNational Chiao Tung University, 1001 Ta-Hsueh Rd., Hsinchu 30010, TaiwanShao‐Yu YangNational Chiao Tung University, 1001 Ta-Hsueh Rd., Hsinchu 30010, TaiwanVita Pi‐Ho HuNational Chiao Tung University, 1001 Ta-Hsueh Rd., Hsinchu 30010, TaiwanYin-Nien ChenNational Chiao Tung University, 1001 Ta-Hsueh Rd., Hsinchu 30010, TaiwanPin SuNational Chiao Tung University, 1001 Ta-Hsueh Rd., Hsinchu 30010, TaiwanChing-Te ChuangNational Chiao Tung University, 1001 Ta-Hsueh Rd., Hsinchu 30010, Taiwan

2014en

ABI

Abstract

No abstract available.

Identifiers

DOI: 10.1016/j.microrel.2013.12.026

Citations and references

Cited by 40 references

Metrics — AkademScholar