Method to Measure the Precipitated and Total Oxygen Concentration in Silicon
L. JastrzȩbskiRCA Laboratories, Princeton, New Jersey 08540P. J. ZanzucchiRCA Laboratories, Princeton, New Jersey 08540D. ThébaultRCA Laboratories, Princeton, New Jersey 08540J. ŁagowskiRCA Laboratories, Princeton, New Jersey 08540
1982en
ABI
Abstract
No abstract available.
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Cited by 30 references