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Interface states at the SiO2-Si interface

M. SchulzInstitut für Angewandte Physik der Universität Erlangen-Nürnberg, Glückstrasse 9, D-8520 Erlangen, Fed. Rep. of Germany
1983en
ABI

Abstract

No abstract available.

Identifiers

DOI
10.1016/0039-6028(83)90551-4

Citations and references

Cited by 30 references
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