ArticleFundamentals of surface and thin film analysisL. C. Feldman·James W. Mayer·F. Adams·1989·enABIABI:AkademIndex/openalex/2026.other.609020CiteAbstractNo abstract available.IdentifiersDOI10.1016/s0003-2670(00)81920-0Citations and referencesCited by 20 referencesMetrics — AkademScholar