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Works citing this work
1 works
Advantages in the Small-Angle Scattering of X-Ray for Studying Optoelectronic Devices within the Frames of ISTC Projects
М. Е. Бойко
,
Andrei M. Boiko
Article
Electron and X-Ray Spectroscopy Techniques
Key engineering materials
2010
0 citations
ABI
ABI:AkademIndex/openalex/2010.article.000271