Tunneling study of clean and oriented Y-Ba-Cu-O and Bi-Sr-Ca-Cu-O surfaces
Jaw-Shen TsaiMicroelectronics Research Laboratories, NEC Corporation, Kawasaki 213, JapanIchiro TakeuchiMicroelectronics Research Laboratories, NEC Corporation, Kawasaki 213, JapanJun‐ichi FujitaFundamental Research Laboratories, NEC Corporation, Kawasaki 213, JapanS. MiuraFundamental Research Laboratories, NEC Corporation, Kawasaki 213, JapanTakahito TerashimaInstitute for Chemical Research, Kyoto University, Uji 611, JapanYoshio BandoInstitute for Chemical Research, Kyoto University, Uji 611, JapanKenji IijimaResearch Institute for Production Development, Kyoto, 606, JapanK. YamamotoResearch Institute for Production Development, Kyoto, 606, Japan
1989en
ABI
Abstract
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Cited by 20 references