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Works citing this work
1 works
Relationship of electrical resistance of polycrystalline tin films to structural characteristics
Б. И. Белевцев
,
Yu. F. Komnik
,
V. E. Kopina
+1
Article
Copper Interconnects and Reliability
Soviet Journal of Low Temperature Physics
1980
1 citations
ABI
ABI:AkademIndex/openalex/2026.other.603988