Crystal Defects as Source of Anomalous Forward Voltage Increase of 4H-SiC Diodes
Peder BergmanLinköping UniversityH. LendenmannABB Corporate ResearchPer Åke NilssonChalmers University of TechnologyU. LindefeltABB Corporate ResearchP. SkyttABB Corporate Research
2001en
ABI
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Cited by 20 references