On-machine and in-process surface metrology for precision manufacturing
Wei GaoTohoku University, JapanHan HaitjemaKU Leuven, BelgiumFengzhou FangTianjin University, ChinaRichard LeachUniversity of Nottingham, UKChi Fai CheungThe Hong Kong Polytechnic University, Hong KongEnrico SavioUniversity of Padova, ItalyJean‐Marc LinaresAix-Marseille Université, France
2019en
ABI
Abstract
No abstract available.
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Cited by 20 references