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A survey on feature selection methods

Girish ChandrashekarElectrical and Microelectronic Engineering, Rochester Institute of Technology, Rochester, NY 14623, USAFerat SahinElectrical and Microelectronic Engineering, Rochester Institute of Technology, Rochester, NY 14623, USA
2013en
ABI

Abstract

No abstract available.

Identifiers

DOI
10.1016/j.compeleceng.2013.11.024

Citations and references

Cited by 20 references
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