S. Panwar
Работ: 1
Indian Institute of Technology, Roorkee
Measurements of evaporation residue cross sections and evaporation-residue-gated <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mi>γ</mml:mi></mml:math>-ray fold distributions for the <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mrow><mml:mmultiscripts><mml:mi mathvariant="normal">S</mml:mi><mml:mprescripts/><mml:none/><mml:mn>32</mml:mn></mml:mmultiscripts><mml:mo>+</mml:mo><mml:mmultiscripts><mml:mi>Sm</mml:mi><mml:mprescripts/><mml:none/><mml:mn>154</mml:mn></mml:mmultiscripts></mml:mrow></mml:math> system
R. Sariyal, I. Mazumdar, Dalip Singh Mehta +11
ABI