Статья

Comparison of X‐ray topographical images in implanted silicon crystals at different absorption conditions

Z. FurmanikInstitute of Physics of Polish Academy of Sciences, Al. Lotnikow 32/46, Warszawa, PolandH. HubrigInstitute of Nuclear Physics of Academy of Sciences of GDR, Rossendorf, GDRM. MaciaszekInstitute of Physics of Bulgarian Academy of Sciences, Sofia, BulgariaI. VassilevInstitute of Physics of Bulgarian Academy of Sciences, Sofia, Bulgaria

Kristall und Technikjournal1979en

ABI

Аннотация

Аннотация отсутствует.

Темы

Crystallography and Radiation Phenomena Particle Detector Development and Performance X-ray Spectroscopy and Fluorescence Analysis

Идентификаторы

DOI: 10.1002/crat.19790140312

Цитирования и источники

Цитирований: 0Использованных источников: 1

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