Induced defect formation in neon cryocrystals under exciton self-trapping

Lattice relaxation processes are studied under self-trapping in the atomic states. The emission spectra of single-center self-trapped excitons in pure Ne and in Ne with Ar, Kr, or Xe as impurities are studied. The contributions of self-trapping in a regular lattice and at initial defects are separated. It is found that local deformations appearing around an excited center in a regular Ne lattice under the action of the electron component during exciton self-trapping lead to structural defects which persist even after the annihilation of the excitation.

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