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Bolometric and noise properties of HTS structures

B. B. BanduryanPhysicotechnical institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR, Kharkov 1S. V. GaponovInstitute of Applied Physics, Academy of Sciences of the USSR, Gorky 2I. M. DmitrenkoPhysicotechnical institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR, Kharkov 1V. G. EfremenkoPhysicotechnical institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR, Kharkov 1Z. F. Krasil’nikInstitute of Applied Physics, Academy of Sciences of the USSR, Gorky 2A. Yu. KlimovInstitute of Applied Physics, Academy of Sciences of the USSR, Gorky 2V. Yu. LavreshinPhysicotechnical institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR, Kharkov 1D. G. Pavel’evInstitute of Applied Physics, Academy of Sciences of the USSR, Gorky 2A. Yu. ChurinInstitute of Applied Physics, Academy of Sciences of the USSR, Gorky 2G. V. ShustakovaPhysicotechnical institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR, Kharkov 1
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Аннотация

The data obtained from the investigations of characteristics of various bolometric elements based on HTS materials are analyzed. It is shown that the thermodynamic temperature fluctuations make a decisive contribution to the noise characteristics of perfect single-crystal films of YBa2Cu3O7–δ with axial orientation at right angles to the substrate used for thermal detection of electromagnetic radiation.

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