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Nonlinear-optical parameters of thin C<sub>60</sub>films at 532 nm

R. A. Ganeev'Akadempribor' Research and Production Association, Academy of Science of Uzbekistan, Tashkent, UzbekistanA.I. RyasnyanskyA. Navoi Samarkand State University, Samarkand, UzbekistanВ. И. Редкоречев'Akadempribor' Research and Production Association, Academy of Science of Uzbekistan, Tashkent, UzbekistanK. FostiropoulosHahn-Meitner-Institut, Berlin, GermanyG. PriebeMax-Born-Institut,Berlin, DeutschlandT. Usmanov'Akadempribor' Research and Production Association, Academy of Science of Uzbekistan, Tashkent, Uzbekistan
Quantum Electronicsjournal2004en
ABI

Аннотация

The real and imaginary parts of the nonlinear third-order susceptibility χ(3) of thin (100 nm) C60 films are studied by the z-scan method at the 532-nm second-harmonic wavelength of a picosecond Nd : YAG laser emitting 55-ps pulses. The change in the sign of Reχ(3) from negative (at a pulse repetition rate f=2 Hz) to positive (at f=0.5 Hz) is explained by the thermal lens effect. The very large values of Reχ(3) [(4.80±0.96)×10-8 cm3 J-1] and Imχ(3) [(1.1±0.2) × 10-8> cm3 J-1] observed in experiments can be caused by the surface enhancement.

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