Kelvin Probe Force Microscopy of Defects in ZnO Nanocrystals Associated with Emission at 3.31 eV
Saidislam KurbanovHeat Physics Department of Uzbekistan Academy of Sciences, Tashkent 700135, UzbekistanWoo Chul YangDepartment of Physics, Dongguk University-Seoul, Seoul 100715, KoreaTae Won KangQuantum-functional Semiconductor Research Center, Dongguk University-Seoul, Seoul 100715, Korea
ABI
Аннотация
The surface potential variations on ZnO nanocrystal surfaces were investigated by using Kelvin probe force microscopy. It was found that the nanocrystal surface contains randomly distributed circular pits with a diameter of ∼100 nm and a depth of ∼30 nm and that the surface potential within the pits is lower than that in the vicinity of the pits. We discuss the correlation between the observed pits and speck-like defects on a ZnO nanocrystal surface associated with the emission at 3.31 eV. We suggest that the reduced surface potential is caused by the local acceptor-like states concentrated near the structural defects.
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