Статья

Average decay rate constants and excitation energies for metal clusters sputtered by SF+5 and inert gas ions

С. Е. МаксимовInstitute of Ion-Plasma and Laser Technology, Uzbek Academy of Sciences, Tashkent, 100125, UzbekistanН. Х. ДжемилевInstitute of Ion-Plasma and Laser Technology, Uzbek Academy of Sciences, Tashkent, 100125, UzbekistanС. Ф. КоваленкоInstitute of Ion-Plasma and Laser Technology, Uzbek Academy of Sciences, Tashkent, 100125, UzbekistanV. I. TugushevInstitute of Ion-Plasma and Laser Technology, Uzbek Academy of Sciences, Tashkent, 100125, UzbekistanО. Ф. ТукфатуллинInstitute of Ion-Plasma and Laser Technology, Uzbek Academy of Sciences, Tashkent, 100125, UzbekistanШ. Т. ХожиевInstitute of Ion-Plasma and Laser Technology, Uzbek Academy of Sciences, Tashkent, 100125, Uzbekistan

Bulletin of the Russian Academy of Sciences Physicsjournal2016en

ABI

Аннотация

Results from a comparative SIMS study of the fragmentation of metal clusters sputtered with atomic Xe+ and molecular SF 5 + ions are presented. It is shown that the average decay rate constants and, hence, the excitation energies of clusters of the same stoichiometry do not depend on the type of bombarding ions.

Темы

Ion-surface interactions and analysis Diamond and Carbon-based Materials Research Mass Spectrometry Techniques and Applications

Идентификаторы

DOI: 10.3103/s1062873816020179

Цитирования и источники

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