Работы, на которые ссылается эта работа

Работ: 5

Работа: Investigation of stepped InP(001)<110> surface by the method of low energy ion scattering

1. Journal of Physics: Conference Series

   Cristiana Bartolomei, Cecilia Mazzoli, Caterina Morganti

   Другое2013Цитирований: 434

   ABIABI:AkademIndex/openalex/2026.other.026879

2. Low energy ion scattering (LEIS) of as-formed and chemically modified display glass and peak-fitting of the Al/Si LEIS peak envelope

   Cody V. Cushman, Philipp Brüner, Julia Zakel +7

   Статья2018Цитирований: 2

   ABIABI:AkademIndex/openalex/2026.other.262424

3. 8 W continuous wave front-facet power from broad-waveguide Al-free 980 nm diode lasers

   L. J. Mawst, Arnab Bhattacharya, J. Lopez +7

   Статья1996Цитирований: 2

   ABIABI:AkademIndex/openalex/2026.other.499776

4. High-current-gain Ga/sub 0.51/In/sub 0.49/P/GaAs heterojunction bipolar transistor grown by gas-source molecular beam epitaxy

   Shey‐Shi Lu, Chibing Huang

   Статья1992Цитирований: 2

   ABIABI:AkademIndex/openalex/2026.other.499777

5. Inelastic energy loss of Ar ions scattered Al2O3 surface under grazing incidence

   Atabek S. Ashirov, Muzaffar Qurbanov, I.U. Tangribergenov +2

   СтатьяIon-surface interactions and analysisPhysics and Chemistry of Solid State2021Цитирований: 1

   ABIABI:AkademIndex/openalex/2026.other.580834