Development of Optoelectronic Control Measurement System Based on Attenuated Total Reflectance Effect
Аннотация
This paper delves into the refractometric methodology for monitoring liquid media within the infrared spectrum, presenting a pioneering design of an optoelectronic system anchored on an attenuated total reflectance element. The proposed system exhibits heightened sensitivity, tailored for precise analysis of optical parameters of liquid media products. Utilizing key components such as light-emitting diodes, a cuvette, the attenuated total reflectance element, and an optical detector, this system epitomizes versatility and efficacy across diverse applications.Through the integration of attenuated total reflectance elements, researchers and engineers can develop highly sensitive instruments, facilitating non-destructive testing, chemical analysis, and environmental monitoring. The inherent flexibility in such systems enables customization to meet specific measurement requirements, ranging from industrial process monitoring to medical diagnostics, by adjusting parameters like angle of incidence, light wavelength, and optical material selection. This paper contributes to advancing optoelectronic control measurement systems, offering enhanced capabilities for accurate and reliable assessment of liquid media properties in various fields.