Статья

Structural, morphological, optical, and electrical properties of SbxSey films with different compositions grown by Chemical-molecular beam deposition method from Separate Sb and Se precursors

T.M. RazykovPhysical-Technical Institute, Chingiz Aytmatov Street 2B, 100084, Tashkent, UzbekistanK.M. KouchkarovPhysical-Technical Institute, Chingiz Aytmatov Street 2B, 100084, Tashkent, UzbekistanB. A. ErgashevPhysical-Technical Institute, Chingiz Aytmatov Street 2B, 100084, Tashkent, UzbekistanР. ХуррамовPhysical-Technical Institute, Chingiz Aytmatov Street 2B, 100084, Tashkent, UzbekistanD. Z. IsakovPhysical-Technical Institute, Chingiz Aytmatov Street 2B, 100084, Tashkent, UzbekistanМ. С. ТивановFaculty of Physics, Belarusian State University, Nezavisimosti Ave. 4, 220030, Minsk, Belarus

Journal of Materials Science Materials in Electronicsjournal2025en

ABI

Аннотация

Аннотация отсутствует.

Темы

Chalcogenide Semiconductor Thin Films Phase-change materials and chalcogenides Solid-state spectroscopy and crystallography

Идентификаторы

DOI: 10.1007/s10854-025-16307-4

Цитирования и источники

Цитирований: 0Использованных источников: 30

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