Статья

Mechanisms of atomic oxygen resistance in POSS-enhanced fluorinated polyimide and high-frequency insulation stability based on PLS analysis

Shengrui ZhouSchool of Electrical Engineering, Shandong University, Jinan, 250061, ChinaLi ZhangSchool of Electrical Engineering, Shandong University, Jinan, 250061, ChinaGuan WangSchool of Electrical Engineering, Shandong University, Jinan, 250061, ChinaBilal Iqbal AyubiSchool of Nuclear Science and Energy, Shandong University, Jinan, 250100, ChinaI U RakhmonovDepartment of Power Supply, Tashkent State Technical University, Tashkent, UzbekistanJunpeng JiFaculty of Electrical Engineering, Xi'an University of Technology, Xi'an, 710048, China

Progress in Organic Coatingsjournal2026en

ABI

Аннотация

Аннотация отсутствует.

Темы

Silicone and Siloxane Chemistry High voltage insulation and dielectric phenomena Surface Modification and Superhydrophobicity

Идентификаторы

DOI: 10.1016/j.porgcoat.2026.109990

Цитирования и источники

Цитирований: 0Использованных источников: 36

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