Статья

Reversible planar gliding and microcracking in a single-crystalline Ni-rich cathode

Yujing BiPacific Northwest National Laboratory, Richland, WA 99352, USAJinhui TaoPacific Northwest National Laboratory, Richland, WA 99352, USAYuqin WuDepartment of Chemical Engineering and Materials Science, Michigan State University, East Lansing, MI 48824, USALinze LiPacific Northwest National Laboratory, Richland, WA 99352, USAYaobin XuPacific Northwest National Laboratory, Richland, WA 99352, USAEnyuan HuChemistry Division, Brookhaven National Laboratory, Upton, NY 11973, USABingbin WuPacific Northwest National Laboratory, Richland, WA 99352, USAJiangtao HuPacific Northwest National Laboratory, Richland, WA 99352, USAChongmin WangPacific Northwest National Laboratory, Richland, WA 99352, USAJi‐Guang ZhangPacific Northwest National Laboratory, Richland, WA 99352, USAYue QiDepartment of Chemical Engineering and Materials Science, Michigan State University, East Lansing, MI 48824, USAJie XiaoMaterials Science and Engineering Department, University of Washington, Seattle, WA 98195, USA

2020en

ABI

Аннотация

High-energy nickel (Ni)-rich cathode will play a key role in advanced lithium (Li)-ion batteries, but it suffers from moisture sensitivity, side reactions, and gas generation. Single-crystalline Ni-rich cathode has a great potential to address the challenges present in its polycrystalline counterpart by reducing phase boundaries and materials surfaces. However, synthesis of high-performance single-crystalline Ni-rich cathode is very challenging, notwithstanding a fundamental linkage between overpotential, microstructure, and electrochemical behaviors in single-crystalline Ni-rich cathodes. We observe reversible planar gliding and microcracking along the (003) plane in a single-crystalline Ni-rich cathode. The reversible formation of microstructure defects is correlated with the localized stresses induced by a concentration gradient of Li atoms in the lattice, providing clues to mitigate particle fracture from synthesis modifications.

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Идентификаторы

DOI: 10.1126/science.abc3167

Цитирования и источники

Цитирований: 2Использованных источников: 0

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