Eclipsing Z-scan measurement of λ/10^4 wave-front distortion
T. XiaCenter for Research in Electro-Optics and Lasers and Department of Physics, University of Central Florida, Orlando, Florida 32816 USADavid J. HaganCenter for Research in Electro-Optics and Lasers and Department of Physics, University of Central Florida, Orlando, Florida 32816 USAMansoor Sheik‐BahaeCenter for Research in Electro-Optics and Lasers and Department of Physics, University of Central Florida, Orlando, Florida 32816 USAEric W. Van StrylandCenter for Research in Electro-Optics and Lasers and Department of Physics, University of Central Florida, Orlando, Florida 32816 USA
1994en
ABI
Аннотация
We introduce a simple modification to the Z-scan technique that results in a sensitivity enhancement that permits measurement of nonlinearly induced wave-front distortion of =lambda/10(4). This sensitivity was achieved with 10-Hz repetition-rate pulsed laser sources. Sensitivity to nonlinear absorption is also enhanced by a factor of =3. This method permits characterization of nonlinear thin films without the need for waveguiding.
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