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Single-Beam Z-Scan: Measurement Techniques and Analysis

Philip B. ChappleDefense Science and Technology Organization, Electronics and Surveillance Research Laboratory, PO Box 1500, Salisbury SA 5108, AustraliaJ. StaromlynskaDefense Science and Technology Organization, Electronics and Surveillance Research Laboratory, PO Box 1500, Salisbury SA 5108, AustraliaJ.A. HermannDefense Science and Technology Organization, Electronics and Surveillance Research Laboratory, PO Box 1500, Salisbury SA 5108, AustraliaT. J. McKayDefense Science and Technology Organization, Electronics and Surveillance Research Laboratory, PO Box 1500, Salisbury SA 5108, AustraliaR. McDuffDepartment of Physics, University of Queensland, St Lucia, Qld 4072, Australia
1997en
ABI

Аннотация

The Z-scan technique is a popular method for measuring degenerate (single frequency) optical nonlinearities using a single laser beam. In order to perform reliable measurements, it is necessary to carefully characterize and control a number of experimental parameters, such as the beam quality, the power and temporal characteristics of the laser, the collection aperture size and position, the sample reflectivity, sample thickness and imperfections in the sample. Failure to control these parameters leads to inaccurate determinations of the nonlinearities. In this paper, we review the theory of Z-scan and examine each of these issues from experimental and theoretical viewpoints. This work will be of interest to anyone who performs Z-scan experiments and to those interested in optical power limiting and nonlinear optical propagation.

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