Работы, цитирующие эту работу

Работ: 1

1. Tunable defect engineering in TiON thin films by multi-step sputtering processes: from a Schottky diode to resistive switching memory

   Teng‐Yu Su, Chi‐Hsin Huang, Yu‐Chuan Shih +5

   СтатьяAdvanced Memory and Neural ComputingJournal of Materials Chemistry C2017Цитирований: 0

   ABIABI:AkademIndex/openalex/2017.article.000071