Статья

Magnetic behavior and spin-lattice coupling in cleavable van der Waals layered <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:msub><mml:mi>CrCl</mml:mi><mml:mn>3</mml:mn></mml:msub></mml:math> crystals

Michael A. McGuireMaterials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USAGenevieve ClarkDepartment of Materials Science and Engineering, University of Washington, Seattle, Washington 98195, USASantosh KCMaterials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USAW. Michael ChanceDepartment of Materials Science and Engineering, The University of Tennessee, Knoxville, Tennessee 37996, USAGerald E. JellisonMaterials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USAValentino R. CooperMaterials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USAXiaodong XuDepartment of Materials Science and Engineering, University of Washington, Seattle, Washington 98195, USAB. C. SalesMaterials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA

2017lv

ABI

Аннотация

Cleavable magnetic materials provide not only a means to study magnetism in the ultimate 2D limit, but also enable increased functionality for van der Waals heterostructures. Here the authors explore the layered antiferromagnet CrCl${}_{3}$. Thermodynamic measurements show ferromagnetic correlations develop before long-range order between the layers is established; van der Waals density functional calculations indicate strong coupling of the magnetism to the crystal lattice, and the authors demonstrate mechanical exfoliation of the bulk crystals into stable monolayer specimens. Together these results show CrCl${}_{3}$ to be a promising compound for studying monolayer magnetism and for integrating magnetism into heterostructures with complementary optoelectronic materials.

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Идентификаторы

DOI: 10.1103/physrevmaterials.1.014001

Цитирования и источники

Цитирований: 2Использованных источников: 0

Показатели — AkademScholar