Статья

Structural Features and Photoelectric Properties of Si-Doped GaAs under Gamma Irradiation

Ye ShenSchool of Physics, University of Electronic Science and Technology of China, Chengdu 610054, ChinaXuan FangState Key Laboratory of High Power Semiconductor Lasers, School of Science, Changchun University of Science and Technology, Changchun 130022, ChinaXiang DingSchool of Physics, University of Electronic Science and Technology of China, Chengdu 610054, ChinaHai-yan XiaoSchool of Physics, University of Electronic Science and Technology of China, Chengdu 610054, ChinaXia XiangSchool of Physics, University of Electronic Science and Technology of China, Chengdu 610054, ChinaGuixia YangInstitute of Nuclear Physics and Chemistry, China Academy of Engineering Physics, Mianyang 621900, ChinaMing JiangSchool of Physics, University of Electronic Science and Technology of China, Chengdu 610054, ChinaXiaotao ZuSchool of Physics, University of Electronic Science and Technology of China, Chengdu 610054, ChinaLiang QiaoSchool of Physics, University of Electronic Science and Technology of China, Chengdu 610054, China

2020en

ABI

Аннотация

GaAs has been demonstrated to be a promising material for manufacturing semiconductor light-emitting devices and integrated circuits. It has been widely used in the field of aerospace, due to its high electron mobility and wide band gap. In this study, the structural and photoelectric characteristics of Si-doped GaAs under different gamma irradiation doses (0, 0.1, 1 and 10 KGy) are investigated. Surface morphology studies show roughen of the surface with irradiation. Appearance of transverse-optical (TO) phonon mode and blueshift of TO peak reflect the presence of internal strain with irradiation. The average strain has been measured to be 0.009 by Raman spectroscopy, indicating that the irradiated zone still has a good crystallinity even at a dose of 10 KGy. Photoluminescence intensity is increased by about 60% under 10 KGy gamma irradiation due to the strain suppression of nonradiative recombination centers. Furthermore, the current of Si-doped GaAs is reduced at 3V bias with the increasing gamma dose. This study demonstrates that the Si-doped GaAs has good radiation resistance under gamma irradiation, and appropriate level of gamma irradiation can be used to enhance the luminescence property of Si-doped GaAs.

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Идентификаторы

DOI: 10.3390/nano10020340

Цитирования и источники

Цитирований: 4Использованных источников: 0

Показатели — AkademScholar