Работы, цитирующие эту работу

Работ: 4

Работа: Fast CdTe and CdZnTe Semiconductor Detector Arrays for Spectroscopic X-Ray Imaging

1. Material classification using basis material decomposition from spectral X-ray CT

   Doniyor Jumanazarov, Asalkhon Alimova, Azamat Abdikarimov +4

   СтатьяAdvanced X-ray and CT ImagingNuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment2023Цитирований: 1

   ABIABI:AkademIndex/openalex/2023.article.001187

2. Material classification using basis material decomposition from spectral x-ray CT

   Doniyor Jumanazarov, Asalkhon Alimova, Henning Friis Poulsen +2

   ПрепринтAdvanced X-ray and CT ImagingResearch Square2022Цитирований: 0

   ABIABI:AkademIndex/openalex/2022.preprint.000042

3. Method for the determination of electron density from multi-energy X-ray CT

   Doniyor Jumanazarov, Asalkhon Alimova, Sh. Kh. Ismoilov +3

   СтатьяAdvanced X-ray and CT ImagingNDT & E International2024Цитирований: 0

   ABIABI:AkademIndex/openalex/2024.article.001478

4. Method for the Correction of Spectral Distortions in X-Ray Photon-Counting Detectors

   Doniyor Jumanazarov, Farruh Atamurotov, Egambergan Xudoynazarov +4

   СтатьяAdvanced X-ray and CT ImagingIEEE Transactions on Instrumentation and Measurement2025Цитирований: 0

   ABIABI:AkademIndex/openalex/2025.article.003296