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Flux creep characteristics in high-temperature superconductors

E. ZeldovIBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598-0218Nabil M. AmerIBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598-0218G. KorenIBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598-0218Arunava GuptaIBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598-0218M. McElfreshIBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598-0218R. J. GambinoIBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598-0218
1990en
ABI

Аннотация

We describe the voltage-current characteristics of YBa2Cu3O7−δ epitaxial films within the flux creep model in a manner consistent with the resistive transition behavior. The magnitude of the activation energy, and its temperature and magnetic field dependences, are readily derived from the experimentally observed power law characteristics and show a (1−T/Tc)3/2 type of behavior near Tc. The activation energy is a nonlinear function of the current density and it enables the determination of the shape of the flux line potential well.

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Цитирований: 2Использованных источников: 0