Статья

Raman spectroscopy as probe of nanometre-scale strain variations in graphene

Christoph NeumannJARA-FIT and 2nd Institute of Physics, RWTH Aachen University, Aachen 52074, GermanySven ReichardtJARA-FIT and 2nd Institute of Physics, RWTH Aachen University, Aachen 52074, GermanyPedro VenezuelaInstituto de Fsica, Universidade Federal Fluminense, Niterói, 24210-346 Rio de Janeiro, BrazilMarc DrögelerJARA-FIT and 2nd Institute of Physics, RWTH Aachen University, Aachen 52074, GermanyLuca BanszerusJARA-FIT and 2nd Institute of Physics, RWTH Aachen University, Aachen 52074, GermanyM. SchmitzJARA-FIT and 2nd Institute of Physics, RWTH Aachen University, Aachen 52074, GermanyKenji WatanabeNational Institute for Materials Science,1-1 Namiki, Tsukuba 305-0044, JapanTakashi TaniguchiNational Institute for Materials Science,1-1 Namiki, Tsukuba 305-0044, JapanFrancesco MauriIMPMC, UMR CNRS 7590, Sorbonne Universités-UPMC Univ. Paris 06, MNHN, IRD, 4 Place Jussieu, Paris 75005, FranceBernd BeschotenJARA-FIT and 2nd Institute of Physics, RWTH Aachen University, Aachen 52074, GermanySlava V. RotkinDepartment of Physics and Center for Advanced Materials and Nanotechnology, Lehigh University, Bethlehem, Pennsylvania 18015, USAChristoph StampferJARA-FIT and 2nd Institute of Physics, RWTH Aachen University, Aachen 52074, Germany

2015en

ABI

Аннотация

Confocal Raman spectroscopy has emerged as a major, versatile workhorse for the non-invasive characterization of graphene. Although it is successfully used to determine the number of layers, the quality of edges, and the effects of strain, doping and disorder, the nature of the experimentally observed broadening of the most prominent Raman 2D line has remained unclear. Here we show that the observed 2D line width contains valuable information on strain variations in graphene on length scales far below the laser spot size, that is, on the nanometre-scale. This finding is highly relevant as it has been shown recently that such nanometre-scaled strain variations limit the carrier mobility in high-quality graphene devices. Consequently, the 2D line width is a good and easily accessible quantity for classifying the crystalline quality, nanometre-scale flatness as well as local electronic properties of graphene, all important for future scientific and industrial applications.

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Идентификаторы

DOI: 10.1038/ncomms9429

Цитирования и источники

Цитирований: 2Использованных источников: 0

Показатели — AkademScholar