Effect of Glass Composition on the Electrical Properties of Thick‐Film Resistors

Ruthenium‐based thick‐film resistors (TFRs) with lead borosilicate glasses of various compositions have been examined for their electrical properties. A striking increase in resistivity has been observed with lead‐depleted glasses, and analysis of this increase reveals that it is derived from the critical loss of Ru ions/clusters in the glass. With high‐lead‐content glasses, the resistivity decreases by two orders of magnitude, in conjunction with the structural inclination of glass toward PbO·SiO 2 , 2PbO·SiO 2 , and 4PbO·B 2 O 3 , which are believed to accommodate more Ru ions/clusters. These behaviors substantiate the role of Ru ions/clusters in glass as an indispensable entity for electrical conduction in TFRs.

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