Sol-gel derived PMN-PT thick film for high frequency ultrasound transducer applications
Аннотация
Piezoelectric 0.65Pb(Mg <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">1/3</sub> Nb <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2/3</sub> )O <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sub> -0.35PbTiO <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sub> thick film with the thickness around 12 ¿m has been deposited on the platinum bufered Si substrate via a composite spin-coating method. The X-ray diffraction analysis and scanning electron microscopy revealed that the film was in the well-crystallized perovskite phase and crack-free. The separation of films from the substrate was achieved using a wet chemical method. The lifted-off film exhibited good dielectric and ferroelectric properties. At 1 kHz, the dielectric constant and the loss were 3326 and 0.037, respectively, while the remnant polarization was 30.0 ¿C/cm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> . A high frequency single element acoustic transducer fabricated with this film showed a bandwidth at -6 dB of 63.6% at 110 MHz.
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