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Si‐Ge‐Metal Ternary Phase Diagram Calculations

Jean‐Pierre FleurialJet Propulsion Laboratory, California Institute of Technology, Pasadena, California 91109A. BorshchevskyJet Propulsion Laboratory, California Institute of Technology, Pasadena, California 91109
1990en
ABI

Аннотация

Solution crystal growth and doping conditions of Si-Ge alloys used for high-temperature thermoelectric generation are determined here. Liquid-phase epitaxy (LPE) has been successfully employed recently to obtain single-crystalline ho-mogeneous layers of Si-Ge solid solutions from a liquid metal solvent. Knowledge of Si-Ge-metallic solvent ernary phase diagrams is essential for further single-crystal growth development. Consequently, a thermodynamic equil ibrium model was used to calculate the phase diagrams of the Si-Ge-M systems, including solid solubilities, where M is A1, Ga, In, Sn, Pb, Sb, or Bi. Good agreement between calculated liquidus and solidus data and experimental DTA and microprobe re-sults was obtained. The results are used to compare the suitability of the different systems for crystal growth (by LPE-type process). The solid solutions between Si and Ge have been of par-ticular interest since their discovery and publication of the phase diagram in 1939 (1). Si-Ge alloy-based high-tempera-ture thermoelectrics are usually prepared by hot-pressing. However, because of material inhomogeneity and grain boundaries, it is difficult o satisfactorily relate the thermal

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