Ionization cross sections for 10<i>–</i>300-keV/u and electron-capture cross sections for 5<i>–</i>150-keV/u<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:mmultiscripts><mml:mrow><mml:mi mathvariant="normal">He</mml:mi></mml:mrow><mml:mrow/><mml:mrow><mml:mn>2</mml:mn><mml:mo>+</mml:mo></mml:mrow><mml:mrow/><mml:mrow/><mml:mprescripts/><mml:mrow/><mml:mrow><mml:mn>3</mml:mn></mml:mrow><mml:mrow/><mml:mrow/></mml:mmultiscripts></mml:mrow></mml:math>ions in gases

Cross sections for production of positive and negative charge for 10--300-keV/u ${\mathrm{He}}^{2+}$ ions on He, Ne, Ar, Kr, ${\mathrm{H}}_{2}$, ${\mathrm{N}}_{2}$, CO, ${\mathrm{O}}_{2}$, ${\mathrm{CH}}_{4}$, ${\mathrm{N}}_{2}$O, and ${\mathrm{CO}}_{2}$ were measured by the transverse-field method. Single- and double-electron-capture cross sections at 5--150 keV/u for the same targets were measured by the method of deflection of different charge-state components of the beam after passing through a known length of target gas. A secondary-emission detector was used to detect the neutral component of the beam. A small least-squares adjustment of the cross sections was made to satisfy the equation ${\ensuremath{\sigma}}_{+}$=${\ensuremath{\sigma}}_{\mathrm{\ensuremath{-}}}$+${\ensuremath{\sigma}}_{21}$+2${\ensuremath{\sigma}}_{20}$ which follows from conservation of charge.

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