Study of the nonlinear refractive index of chalcogenide films by the RZ-scan method

Results of studying nonlinear refraction of chalcogenide films by the RZ-scan method with the use of radiation of a picosecond Nd:YAG laser (λ = 532 nm) are presented. The sign of the nonlinear refractive index is analyzed with the help of the Kramers-Kronig relations. Mechanisms of nonlinear refraction in materials are discussed.

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