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Short-lived primary radiation defects in LiF crystals

Л. А. ЛисицынаTomsk State Civil Engineering University, Solyanaya pl. 2, Tomsk, 634003, RussiaT. V. GrechkinaTomsk Polytechnical University, Tomsk, 634034, RussiaV. I. KorepanovTomsk Polytechnical University, Tomsk, 634034, RussiaВ. М. ЛисицынTomsk Polytechnical University, Tomsk, 634034, Russia
2001en
ABI

Аннотация

The spectral and kinetic parameters of electron-pulse-initiated transient absorption and emission of LiF crystals were studied using pulsed spectrometry with a nanosecond time resolution. The measurements were performed in the spectral region of 6 eV, the temperature range of 11–150 K, and within 10−8–10 s after the termination of an electron pulse. It is shown that the electron-pulse irradiation not only gives rise to F, V k , and H centers in the LiF crystal but also to certain short-lived defects of two types that differ in the spectral positions of the absorptive and radiative transitions, the lifetime, and the temperature dependence of the production efficiency. Defects of type I feature absorptive transitions at 5.5 and 5.1 eV and a radiative transition at 5.8 eV, whereas the absorptive transitions at 5.3 and 4.75 eV and a radiative transition at 4.4 eV are characteristic of type-II defects. It is found that a variation in the ratio between the concentrations of the different types of short-lived centers in the range of 11–150 K does not affect the quantum efficiency of the F centers. It is assumed that the observed centers are self-trapped excitons of various types.

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