Работы, цитирующие эту работу

Работ: 2

Работа: Chemical trends of defect formation and doping limit in II-VI semiconductors: The case of CdTe

1. Study of polycrystalline CdTe films by contact and contactless pulsed photo-ionization spectroscopy

   E. Gaubas, T. Čeponis, D. Dobrovolskas +6

   СтатьяChalcogenide Semiconductor Thin FilmsThin Solid Films2018Цитирований: 4

   ABIABI:AkademIndex/openalex/2018.article.000311

2. Influence of composition and heat treatment in CdCl2 solution on intrinsic point defects in CdTe films

   B. A. Ergashev, T.M. Razykov

   СтатьяChalcogenide Semiconductor Thin FilmsApplied Solar Energy2017Цитирований: 0

   ABIABI:AkademIndex/openalex/2017.article.000926