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Thermal Expansions of Solid Argon, Krypton, and Xenon above 1 K

C. R. TilfordInstitute for Atomic Research and Department of Physics, Iowa State University, Ames, Iowa 50010C. A. SwensonInstitute for Atomic Research and Department of Physics, Iowa State University, Ames, Iowa 50010
1972en
ABI

Аннотация

A differential parallel-plate capacitance dilatometer has been used to measure the linear thermal-expansion coefficients of free-standing samples of solid argon (1-35 K), krypton (1-45 K), and xenon (1-105 K). The present data for argon and krypton are systematically larger than existing x-ray lattice-parameter data above 20 K by a constant proportionality factor which varies from 1 to 3% for different runs and different samples and which most likely is due to bonding of the samples to the capacitor plates. These data have been normalized using the x-ray results. The xenon results agree with other published data without the use of a scale factor. Temperature-dependent Gr\"uneisen parameters $\ensuremath{\gamma}$ are calculated for these solids using available thermodynamic data. These calculations give ${\ensuremath{\gamma}}_{0}=2.7\ifmmode\pm\else\textpm\fi{}0.1$ for argon, 2.67 \ifmmode\pm\else\textpm\fi{} 0.07 for krypton, and 2.5 \ifmmode\pm\else\textpm\fi{} 0.1 for xenon, with the major uncertainty occurring through the bulk-modulus data.

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