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Gallium Phosphide Window Layer for Silicon Solar Cells

Markus FeifelFraunhofer Institute for Solar Energy Systems (ISE), Freiburg, GermanyThomas RachowFraunhofer Institute for Solar Energy Systems (ISE), Freiburg, GermanyJan BenickFraunhofer Institute for Solar Energy Systems (ISE), Freiburg, GermanyJens OhlmannFraunhofer Institute for Solar Energy Systems (ISE), Freiburg, GermanyS. JanzFraunhofer Institute for Solar Energy Systems (ISE), Freiburg, GermanyMartin HermleFraunhofer Institute for Solar Energy Systems (ISE), Freiburg, GermanyFrank DimrothFraunhofer Institute for Solar Energy Systems (ISE), Freiburg, GermanyDavid LacknerFraunhofer Institute for Solar Energy Systems (ISE), Freiburg, Germany
2015en
ABI

Аннотация

The integration of III-V compound semiconductors on a silicon bottom cell offers the opportunity to form two- and three-junction solar cells with a conversion efficiency exceeding 30%. This paper reports on the progress in the heteroepitaxial nucleation of gallium phosphide (GaP) on silicon, which allows the fabrication of a silicon bottom cell with front-surface passivation by a thin single-crystalline GaP window layer. GaP has a low lattice-mismatch to Si and an indirect bandgap energy of 2.26 eV, which leads to low absorption. At the same time, GaP can be doped with silicon to form an n-type contact layer. In this publication, we investigate n-Si/p-Si homojunction solar cells with a GaP window and contact layer. Metal-organic vapor phase epitaxy was used to deposit the 60-nm GaP window layer with a low density of antiphase boundaries at the heterointerface and without misfit dislocations. Open-circuit voltages of up to 634 mV have been obtained under 1-sun AM1.5g conditions for devices without antireflective coatings.

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