Работы, цитирующие эту работу

Работ: 2

Работа: Fundamentals of surface and thin film analysis

1. RBS analysis of ions implanted in light substrates exposed to hot plasmas laser-generated at PALS

   L. Torrisi, S. Gammino, A. Picciotto +5

   СтатьяIon-surface interactions and analysisRadiation effects and defects in solids2005Цитирований: 0

   ABIABI:AkademIndex/openalex/2005.article.000167

2. Study of doping uniformity of a 200 kV ion implanter by RBS and sheet resistance measurements

   Hui Li, Ze-Song Wang, Shengjun Zhang +5

   СтатьяIon-surface interactions and analysisNuclear Science and Techniques2016Цитирований: 0

   ABIABI:AkademIndex/openalex/2016.article.000334